![header thumbnail](/images/publishers\on_cover.gif)
OVE EN IEC 60749-10:2024 01 01
Current
Current
The latest, up-to-date edition.
![header thumbnail](/images/publishers\on_cover.gif)
Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock - Device and subassembly
Available format(s)
Hardcopy
Language(s)
English, German
Published date
01-01-2024
Committee |
TC 47
|
DocumentType |
Test Method
|
Pages |
32
|
ProductNote |
This standard also identical to IEC 60749-10:2022
|
PublisherName |
Osterreichisches Normungsinstitut/Austrian Standards
|
Status |
Current
|
Supersedes |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.