OVE EN IEC 60749-10:2024 01 01
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock - Device and subassembly
Available format(s)
Hardcopy
Language(s)
English, German
Published date
01-01-2024
€79.20
Excluding VAT
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| Pages |
32
|
| ProductNote |
This standard also identical to IEC 60749-10:2022
|
| PublisherName |
Osterreichisches Normungsinstitut/Austrian Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN IEC 60749-10:2022 | Identical |
Summarise
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Important note : Users cannot be edited or removed once added to your Multi user PDF.