Semiconductor devices - Mechanical and climatic test methods -- Part 18: Ionizing radiation (total dose) (( IEC 60749-18:2019) EN IEC 60749-18:2019) (english version)

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Hardcopy

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English, German

Published date

01-03-2020

Publisher

Osterreichisches Normungsinstitut/Austrian Standards

This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.

Committee	TC 47
DocumentType	Standard
ISBN	978-2-8322-6755-4
Pages	0
ProductNote	GERMAN VERSION CONTENT THAT PAGES 26
PublisherName	Osterreichisches Normungsinstitut/Austrian Standards
Status	Current

Standards	Relationship
IEC 60749-18:2019	Identical
EN IEC 60749-18:2019	Identical

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OVE EN IEC 60749-18: 2020 03 01

Semiconductor devices - Mechanical and climatic test methods -- Part 18: Ionizing radiation (total dose) (( IEC 60749-18:2019) EN IEC 60749-18:2019) (english version)

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