OVE EN IEC 60749-30:2023 03 01
Current
Current
The latest, up-to-date edition.
Semiconductor devices – Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Available format(s)
Hardcopy
Language(s)
English, German
Published date
01-03-2023
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
36
|
| PublisherName |
Osterreichisches Normungsinstitut/Austrian Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-30:2020 | Identical |
| EN IEC 60749-30:2020 | Identical |
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