PD IEC/TR 62433-2-1:2010
Current
The latest, up-to-date edition.
EMC IC modelling Theory of black box modelling for conducted emission
Hardcopy , PDF
English
28-02-2011
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FOREWORD
1 Scope
2 Integrated circuit and modelling board
3 Assumptions
4 Modelling
5 Parameter extractions
6 Implementation
Annex A (informative) - Nodal equation
Annex B (informative) - Example of black box modelling
Bibliography
Describes black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This part of IEC 62433-2-1 covers black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors.
This technical report is intended to provide the theoretical background on black box modelling for IC conducted emission.
| Standards | Relationship |
| IEC TR 62433-2-1:2010 | Identical |
| IEC 62014-1:2001 | Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2) |
| IEC TS 62404:2007 | Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3) |
| IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
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