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PD IEC/TR 62433-2-1:2010

Current

Current

The latest, up-to-date edition.

EMC IC modelling Theory of black box modelling for conducted emission

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

28-02-2011

€231.38
Excluding VAT

FOREWORD
1 Scope
2 Integrated circuit and modelling board
3 Assumptions
4 Modelling
5 Parameter extractions
6 Implementation
Annex A (informative) - Nodal equation
Annex B (informative) - Example of black box modelling
Bibliography

Describes black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors.

Committee
EPL/47
DocumentType
Standard
Pages
32
PublisherName
British Standards Institution
Status
Current

This part of IEC 62433-2-1 covers black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors.

This technical report is intended to provide the theoretical background on black box modelling for IC conducted emission.

Standards Relationship
IEC TR 62433-2-1:2010 Identical

IEC 62014-1:2001 Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2)
IEC TS 62404:2007 Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework

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