PD ISO/TR 21477:2017
Current
The latest, up-to-date edition.
Optics and photonics. Preparation of drawings for optical elements and systems. Surface imperfection specification and measurement systems
27-09-2017
| Committee |
CPW/172
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This document intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO10110‑7 and ISO14997 , specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.
| Standards | Relationship |
| ISO/TR 21477:2017 | Identical |
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