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PN-EN 15991:2026-02

Current

Current

The latest, up-to-date edition.

Analysis of Ceramic Raw Materials and Materials -- Direct determination of impurities, expressed in mass fractions, in silicon carbide powders and granules by optical emission spectrometry with inductively coupled plasma with electrochemical evaporation (ETV-ICP-OES)

Available format(s)

Hardcopy

Language(s)

English

Published date

20-02-2026

DocumentType
Standard
Pages
30
PublisherName
Polish Committee for Standardization
Status
Current
Supersedes

Standards Relationship
EN 15991:2025 Identical