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PN EN 60749-27 : 2008 AMD 1 2013
Current
Current
The latest, up-to-date edition.
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
Published date
12-01-2013
Publisher
Committee |
TC 60
|
DevelopmentNote |
AMD 1 2013 is only available in English. (09/2013)
|
DocumentType |
Standard
|
PublisherName |
Polish Committee for Standardization
|
Status |
Current
|
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