PN EN 60749-29 : 2011
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
Published date
12-01-2013
Publisher
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Describes the I-test and the overvoltage latch-up testing of integrated circuits.
| Committee |
TC 60
|
| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-29:2011 | Identical |
| IEC 60749-29:2011 | Identical |
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