PN EN 61747-6-3 : 2012
Current
Current
The latest, up-to-date edition.
LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
Published date
12-01-2013
Publisher
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Provides general procedures for quality assessment and general rules for the motion artifact measurement of active matrix liquid crystal displays.
| Committee |
TC 60
|
| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61747-6-3:2011 | Identical |
| EN 61747-6-3 : 2011 | Identical |
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