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PN EN 62047-11 : 2014

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 11: TEST METHOD FOR COEFFICIENTS OF LINEAR THERMAL EXPANSION OF FREE-STANDING MATERIALS FOR MICRO-ELECTROMECHNICAL SYSTEMS

Published date

07-04-2014

Committee
TC 60
DocumentType
Standard
PublisherName
Polish Committee for Standardization
Status
Current

Standards Relationship
EN 62047-11 : 2013 Identical
IEC 62047-11:2013 Identical

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