PN EN 62047-14 : 2012
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 14: FORMING LIMIT MEASURING METHOD OF METALLIC FILM MATERIALS
Published date
12-01-2013
Publisher
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Specifies definitions and procedures for measuring the forming limit of metallic film materials with a thickness range from 0,5 micrometer to 300 micrometers.
| Committee |
TC 60
|
| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62047-14:2012 | Identical |
| EN 62047-14:2012 | Identical |
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