PN-EN IEC 60749-37:2023-07
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 37: Plate drop test method using accelerometer
Available format(s)
Hardcopy
Language(s)
English
Published date
12-07-2023
Publisher
| DocumentType |
Test Method
|
| Pages |
30
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-37:2022 | Identical |
| EN IEC 60749-37:2022 | Identical |
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