PN-EN IEC 60749-41:2021-04
Current
Current
The latest, up-to-date edition.
Semiconductor devices — Mechanical and climatic test methods — Part 41: Standard test methods for the reliability of non-volatile memories
Available format(s)
Hardcopy
Language(s)
English
Published date
20-04-2021
Publisher
Excluding VAT
| DocumentType |
Test Method
|
| Pages |
30
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| EN IEC 60749-41:2020 | Identical |
| IEC 60749-41:2020 | Identical |
Summarise