PNE-EN 60749-27:2006/FprA1
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Published date
04-12-2012
Publisher
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Committee |
CTN 209/SC 47
|
DocumentType |
Standard
|
PublisherName |
Asociacion Espanola de Normalizacion
|
Status |
Current
|
Standards | Relationship |
EN 60749-27:2006/A1:2012 | Identical |
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