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PNE-EN 60749-27:2006/FprA1

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Published date

04-12-2012

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Committee
CTN 209/SC 47
DocumentType
Standard
PublisherName
Asociacion Espanola de Normalizacion
Status
Current

Standards Relationship
EN 60749-27:2006/A1:2012 Identical

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