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PNE-FprEN 60749-4:2016

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Published date

21-06-2017

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Committee
CTN 209/SC 47
DocumentType
Standard
PublisherName
Asociacion Espanola de Normalizacion
Status
Current

Standards Relationship
EN 60749-4:2017 Identical
IEC 60749-4:2017 Identical

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