PNE-FprEN 60749-4:2016
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Published date
21-06-2017
Publisher
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| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-4:2017 | Identical |
| IEC 60749-4:2017 | Identical |
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