PNE-FprEN 62374-1
Current
Current
The latest, up-to-date edition.
Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Published date
03-02-2011
Publisher
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| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
| Standards | Relationship |
| EN 62374-1:2010 | Identical |
| IEC 62374-1:2010 | Identical |
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