PNE-prEN 60749-38
Current
Current
The latest, up-to-date edition.
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory
Published date
08-08-2008
Publisher
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| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-38:2008 | Identical |
| EN 60749-38:2008 | Identical |
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