Name: SAC GB/T 45716:2025 - Bias temperature instability testing of metal-oxide-semiconductor field-effect transistors (MOSFETs)
Brand: Standardization Administration of China

Bias temperature instability testing of metal-oxide-semiconductor field-effect transistors (MOSFETs)

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Hardcopy

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English

Published date

30-05-2025

Publisher

Standardization Administration of China

€232.22

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DocumentType	Standard
Pages	731
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 62373:2006	Identical

€232.22

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SAC GB/T 45716:2025

Bias temperature instability testing of metal-oxide-semiconductor field-effect transistors (MOSFETs)

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