Name: SAC GB/T 45718:2025 - Time-dependent dielectric breakdown (TDDB) test between internal metal layers of semiconductor devices
Brand: Standardization Administration of China

Time-dependent dielectric breakdown (TDDB) test between internal metal layers of semiconductor devices

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Hardcopy

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English

Published date

30-05-2025

Publisher

Standardization Administration of China

€295.41

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DocumentType	Standard
Pages	732
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 62374-1:2010	Identical

€295.41

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SAC GB/T 45718:2025

Time-dependent dielectric breakdown (TDDB) test between internal metal layers of semiconductor devices

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