Name: SAC GB/T 4937.10:2025 - Semiconductor Device Mechanical and Climate Testing Methods Part 10: Mechanical Shock Devices and Assemblies
Brand: Standardization Administration of China

Semiconductor Device Mechanical and Climate Testing Methods Part 10: Mechanical Shock Devices and Assemblies

Available format(s)

Hardcopy

Language(s)

English

Published date

31-12-2025

Publisher

Standardization Administration of China

€295.41

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DocumentType	Test Method
Pages	709
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-10:2022	Identical

€295.41

Excluding VAT

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SAC GB/T 4937.10:2025

Semiconductor Device Mechanical and Climate Testing Methods Part 10: Mechanical Shock Devices and Assemblies

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