Name: SAC GB/T 4937.28:2026 - Semiconductor Device Mechanical and Climate Testing Methods Part 28: Electrostatic Discharge (ESD) Sensitivity Testing of Charged Device Models (CDM) Device Level
Brand: Standardization Administration of China

Semiconductor Device Mechanical and Climate Testing Methods Part 28: Electrostatic Discharge (ESD) Sensitivity Testing of Charged Device Models (CDM) Device Level

Available format(s)

Hardcopy

Language(s)

English

Published date

27-02-2026

Publisher

Standardization Administration of China

€737.72

Excluding VAT

Summarise this standard

AI-generated summary

DocumentType	Test Method
Pages	703
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-28:2022	Identical

€737.72

Excluding VAT

Product format

I agree to the DRM document license rules apply against the PDF selection made.

Please confirm that you agree to the document license rules for this document.

I agree to the document license rules .

Please confirm that you agree to the document license rules for this document.

Shopping Cart

SAC GB/T 4937.28:2026

Semiconductor Device Mechanical and Climate Testing Methods Part 28: Electrostatic Discharge (ESD) Sensitivity Testing of Charged Device Models (CDM) Device Level

General Product Information

International Equivalents

Industry

Sub-Industry