Name: SAC GB/T 4937.29:2025 - Semiconductor Device Mechanical and Climate Testing Methods Part 29: Latch-up Testing
Brand: Standardization Administration of China

Semiconductor Device Mechanical and Climate Testing Methods Part 29: Latch-up Testing

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Hardcopy

Language(s)

English

Published date

02-12-2025

Publisher

Standardization Administration of China

€421.78

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DocumentType	Test Method
Pages	721
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-29:2011	Identical

€421.78

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SAC GB/T 4937.29:2025

Semiconductor Device Mechanical and Climate Testing Methods Part 29: Latch-up Testing

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