Name: SAC GB/T 4937.37:2025 - Semiconductor Device Mechanical and Climate Testing Methods Part 37: Plate Drop Testing Methods Using Accelerometers
Brand: Standardization Administration of China

Semiconductor Device Mechanical and Climate Testing Methods Part 37: Plate Drop Testing Methods Using Accelerometers

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Hardcopy

Language(s)

English

Published date

31-12-2025

Publisher

Standardization Administration of China

€358.59

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DocumentType	Test Method
Pages	710
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-37:2022	Identical

€358.59

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SAC GB/T 4937.37:2025

Semiconductor Device Mechanical and Climate Testing Methods Part 37: Plate Drop Testing Methods Using Accelerometers

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