SAC GB/T 4937-4 : 2012
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
Published date
25-03-2013
Publisher
Sorry this product is not available in your region.
| DocumentType |
Standard
|
| PublisherName |
Standardization Administration of China
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-4:2017 | Identical |
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