Name: SAC GB/T 4937.40:2025 - Semiconductor Device Mechanical and Climate Testing Methods Part 40: Plate Drop Testing Methods Using Strain Gauges
Brand: Standardization Administration of China

Semiconductor Device Mechanical and Climate Testing Methods Part 40: Plate Drop Testing Methods Using Strain Gauges

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Hardcopy

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English

Published date

31-12-2025

Publisher

Standardization Administration of China

€358.59

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DocumentType	Test Method
Pages	712
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-40:2011	Identical

€358.59

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SAC GB/T 4937.40:2025

Semiconductor Device Mechanical and Climate Testing Methods Part 40: Plate Drop Testing Methods Using Strain Gauges

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