Name: SAC GB/T 4937.41:2026 - Semiconductor Devices Mechanical and Climate Testing Methods Part 41: Reliability Testing Methods for Non-Volatile Memory
Brand: Standardization Administration of China

Semiconductor Devices Mechanical and Climate Testing Methods Part 41: Reliability Testing Methods for Non-Volatile Memory

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Hardcopy

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English

Published date

27-02-2026

Publisher

Standardization Administration of China

€295.41

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DocumentType	Test Method
Pages	704
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-41:2020	Identical

€295.41

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SAC GB/T 4937.41:2026

Semiconductor Devices Mechanical and Climate Testing Methods Part 41: Reliability Testing Methods for Non-Volatile Memory

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