Name: SAC GB/T 4937.44:2025 - Semiconductor Device Mechanical and Climate Testing Methods Part 44: Neutron Irradiation Single Event Effect (SEE) Testing Methods for Semiconductor Devices
Brand: Standardization Administration of China

Semiconductor Device Mechanical and Climate Testing Methods Part 44: Neutron Irradiation Single Event Effect (SEE) Testing Methods for Semiconductor Devices

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Hardcopy

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English

Published date

02-12-2025

Publisher

Standardization Administration of China

€295.41

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DocumentType	Test Method
Pages	725
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-44:2016	Identical

€295.41

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SAC GB/T 4937.44:2025

Semiconductor Device Mechanical and Climate Testing Methods Part 44: Neutron Irradiation Single Event Effect (SEE) Testing Methods for Semiconductor Devices

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