Name: SAC GB/T 4937.9:2026 - Semiconductor Device Mechanical and Climate Testing Methods Part 9: Marking Durability
Brand: Standardization Administration of China

Semiconductor Device Mechanical and Climate Testing Methods Part 9: Marking Durability

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Hardcopy

Language(s)

English

Published date

27-02-2026

Publisher

Standardization Administration of China

€169.03

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DocumentType	Standard
Pages	705
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-9:2017	Identical

€169.03

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SAC GB/T 4937.9:2026

Semiconductor Device Mechanical and Climate Testing Methods Part 9: Marking Durability

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