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SAE ARP 6338 : 2015

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

PROCESS FOR ASSESSMENT AND MITIGATION OF EARLY WEAROUT OF LIFE-LIMITED MICROCIRCUITS

Available format(s)

Hardcopy , PDF

Superseded date

12-02-2019

Superseded by

SAE ARP6338A:2019

Language(s)

English

Published date

01-01-2015

€108.76
Excluding VAT

FOREWORD
1. SCOPE
2. REFERENCES
3. LIFE-LIMITED MICROCIRCUIT IDENTIFICATION,
   ASSESSMENT, AND MITIGATION PROCESS
4. REPORT
5. TERMS, DEFINITIONS, ABBREVIATIONS, AND
   ACRONYMS
6. NOTES
APPENDIX A - PROCESS FLOW
APPENDIX B - LIST OF POTENTIALLY LIFE-LIMITED
             MICROCIRCUITS
APPENDIX C - EVALUATION OF DATA AND ACCELERATION
             MODELS
APPENDIX D - ACCELERATION MODELS
APPENDIX E - MITIGATION METHODS
APPENDIX F - ALTERNATIVE METHODS
APPENDIX G - LIFE-LIMITED MICROCIRCUIT REPORT

Proposes for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in ADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the ADHP equipment to assess those designs and mitigations.

DocumentType
Standard
Pages
14
PublisherName
SAE International
Status
Superseded
SupersededBy

SAE AS 6294/2 : 2018 REQUIREMENTS FOR PLASTIC ENCAPSULATED MICROCIRCUITS IN MILITARY AND AVIONICS APPLICATIONS
SAE ARP 5890 : 2011 GUIDELINES FOR PREPARING RELIABILITY ASSESSMENT PLANS FOR ELECTRONIC ENGINE CONTROLS
IEC TS 62239-2:2017 Process management for avionics - Management plan - Part 2: Preparation and maintenance of an electronic COTS assembly management plan
EIA STD 4899 : 2017-05 REQUIREMENTS FOR AN ELECTRONIC COMPONENTS MANAGEMENT PLAN
PD IEC/TS 62239-2:2017 Process management for avionics. Management plan Preparation and maintenance of an electronic COTS assembly management plan

VITA 51.2 : 2016 PHYSICS OF FAILURE RELIABILITY PREDICTIONS

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