SAE ARP6338

FOREWORD
1. SCOPE
2. REFERENCES
3. LIFE-LIMITED MICROCIRCUIT IDENTIFICATION,
   ASSESSMENT, AND MITIGATION PROCESS
4. REPORT
5. TERMS, DEFINITIONS, ABBREVIATIONS, AND
   ACRONYMS
6. NOTES
APPENDIX A - PROCESS FLOW
APPENDIX B - LIST OF POTENTIALLY LIFE-LIMITED
             MICROCIRCUITS
APPENDIX C - EVALUATION OF DATA AND ACCELERATION
             MODELS
APPENDIX D - ACCELERATION MODELS
APPENDIX E - MITIGATION METHODS
APPENDIX F - ALTERNATIVE METHODS
APPENDIX G - LIFE-LIMITED MICROCIRCUIT REPORT

Proposes for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in ADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the ADHP equipment to assess those designs and mitigations.

This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in ADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the ADHP equipment to assess those designs and mitigations.This document focuses on the LLM wearout assessment process. It acknowledges that the ADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process.