SAE ARP6338A
Current
The latest, up-to-date edition.
Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits
Hardcopy , PDF
English
08-02-2019
This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations.
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
SAE International
|
| Status |
Current
|
| Supersedes |
This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations.This document focuses on the LLM wearout assessment process. It acknowledges that the AADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process.
| SAE J3168_202112 | Reliability Physics Analysis of Electrical, Electronic, and Electromechanical Equipment, Modules and Components |
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