SAE ARP6338A:2019
Current
The latest, up-to-date edition.
Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits
Hardcopy , PDF
English
08-02-2019
Important note : Users cannot be edited or removed once added to your Multi user PDF.This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations.
| Committee |
APMC
|
| DocumentType |
Revision
|
| Pages |
14
|
| PublisherName |
SAE International
|
| Status |
Current
|
| Supersedes |
| SAE J3168:2021 | Reliability Physics Analysis of Electrical, Electronic, and Electromechanical Equipment, Modules and Components |
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