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SAE AS 6171/11 : 2016

Current

Current

The latest, up-to-date edition.

TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-10-2016

€93.68
Excluding VAT

1. SCOPE
2. REFERENCES
3. EQUIPMENT AND OTHER SUPPLIES
4. TEST SAMPLE
5. MATERIALS HANDLING, STORAGE, AND SAMPLE PREPARATION
6. DESCRIPTION OF METHODOLOGY
7. CONTROLS AND CALIBRATION
8. ANALYSIS AND INTERPRETATION OF DATA
9. REPORTING OF RESULTS
10. QUALIFICATION AND CERTIFICATION
11. NOTES

Describes the requirements, capabilities, and limitations associated with the application of Design Recovery for the detection of counterfeit electronic parts including: Operator training; Sample preparation; Imaging techniques; Data interpretation; Design/functional matching; Equipment maintenance and; Reporting of data.

Committee
G-19A
DocumentType
Test Method
Pages
10
PublisherName
SAE International
Status
Current

18/30373170 DC : 0 BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES
IEC TS 62668-2:2016 Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources
PD IEC/TS 62668-2:2016 Process management for avionics. Counterfeit prevention Managing electronic components from non-franchised sources
SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS

SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
ANSI/ISO/IEC 17025:2005 General Requirements For The Competence Of Testing And Calibration Laboratories
IPC J STD 033C-1:2014 HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES
SAE AS 6171/4 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS

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