SAE AS 6171/4 : 2016
Current
The latest, up-to-date edition.
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS
Hardcopy , PDF
English
30-10-2016
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1. SCOPE
2. REFERENCES
3. DESCRIPTION OF THE METHODOLOGY/PROCEDURE - MICROCIRCUITS,
HYBRIDS, DIODES, AND TRANSISTORS
4. DESCRIPTION OF THE PROCEDURE - RESISTORS, CAPACITORS,
INDUCTORS, FILTERS, CONNECTORS, CABLES, FUSES, TRANSFORMERS
(PASSIVE DEVICES)
5. TEST EQUIPMENT, TEST SAMPLES, AND CALIBRATION
6. DETAILED REQUIREMENTS
7. ALTERNATE PACKAGE/MATERIAL TYPES
8. NOTES
APPENDIX A - DECAPSULATION AND PHOTO-DOCUMENTATION EXAMPLES
APPENDIX B - VISUAL ANOMALY EXAMPLES
APPENDIX C - UNACCEPTABLE DECAPSULATION RESULTS
APPENDIX D - PROFICIENCY SAMPLE QUESTIONS (FOR INTERNAL USE ONLY)
Regulates inspection, test procedures and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) components or parts utilizing Delid/Decapsulation Physical Analysis.
| Committee |
G-19A
|
| DocumentType |
Test Method
|
| Pages |
36
|
| PublisherName |
SAE International
|
| Status |
Current
|
| 18/30373170 DC : 0 | BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES |
| SAE AS 6171/11 : 2016 | TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS |
| IEC TS 62668-2:2016 | Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources |
| SAE AS 6171 : 2016 | TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS |
| PD IEC/TS 62668-2:2016 | Process management for avionics. Counterfeit prevention Managing electronic components from non-franchised sources |
| SAE AS 6171 : 2016 | TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| SAE AS 6171/5 : 2016 | TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS |
| MIL-STD-1580 Revision B:2003 | DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS |
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