SAE HS 784 : 2003
Current
Current
The latest, up-to-date edition.
RESIDUAL STRESS MEASUREMENT BY X-RAY DIFFRACTION
Published date
14-02-2013
Publisher
Sorry this product is not available in your region.
Purpose is not to incorporate all of the research in the fields of x-ray and neutron diffraction but to focus on the practical applications of x-ray diffraction techniques useful to members of the automotive engineering related industries.
| DocumentType |
Standard
|
| PublisherName |
SAE International
|
| Status |
Current
|
| SAE AMS 2580 : 2013 | SHOT PEENING, ULTRASONICALLY ACTIVATED |
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