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  • SAE J 1752/1 : 2016

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS - INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES - GENERAL AND DEFINITIONS

    Available format(s):  Hardcopy, PDF

    Superseded date:  08-10-2021

    Language(s):  English

    Published date:  01-01-2016

    Publisher:  SAE International

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. REFERENCES
    3. DEFINITIONS
    4. TEST CONDITIONS
    5. TEST EQUIPMENT
    6. GENERAL BASIC TEST BOARD SPECIFICATION
    7. TEST SETUP
    8. TEST PROCEDURE
    9. TEST REPORT
    10. DATA PRESENTATION
    11. INTERPRETATION OF RESULTS
    12. NOTES
    APPENDIX A (INFORMATIVE) - FLOW CHART OF AN EXAMPLE COUNTER TEST CODE
    APPENDIX B (INFORMATIVE) - WORST CASE SOFTWARE DESCRIPTION
    APPENDIX C (INFORMATIVE) - EXAMPLE CALIBRATION AND SET UP
                               VERIFICATION SHEET

    Abstract - (Show below) - (Hide below)

    Gives supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.

    General Product Information - (Show below) - (Hide below)

    Document Type Standard
    Publisher SAE International
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    SAE J 2578 : 2014 RECOMMENDED PRACTICE FOR GENERAL FUEL CELL VEHICLE SAFETY
    SAE J 1752/2 : 2016 MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - SURFACE SCAN METHOD (LOOP PROBE METHOD) 10 MHZ TO 3 GHZ
    SAE J 1752/3 : 2017 MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - TEM/WIDEBAND TEM (GTEM) CELL METHOD; TEM CELL (150 KHZ TO 1 GHZ), WIDEBAND TEM CELL (150 KHZ TO 8 GHZ)

    Standards Referencing This Book - (Show below) - (Hide below)

    SAE J 1752/2 : 2016 MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - SURFACE SCAN METHOD (LOOP PROBE METHOD) 10 MHZ TO 3 GHZ
    SAE J 1752/3 : 2011 MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - TEM/WIDEBAND TEM (GTEM) CELL METHOD; TEM CELL (150 KHZ TO 1 GHZ), WIDEBAND TEM CELL (150 KHZ TO 8 GHZ)
    SAE J 1113/1 : 2013 ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES AND LIMITS FOR COMPONENTS OF VEHICLES, BOATS (UP TO 15 M), AND MACHINES (EXCEPT AIRCRAFT) (16.6 HZ TO 18 GHZ)
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