SAE J1752/1_201605
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS - INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES - GENERAL AND DEFINITIONS
Hardcopy , PDF
08-10-2021
English
01-01-2016
1. SCOPE
2. REFERENCES
3. DEFINITIONS
4. TEST CONDITIONS
5. TEST EQUIPMENT
6. GENERAL BASIC TEST BOARD SPECIFICATION
7. TEST SETUP
8. TEST PROCEDURE
9. TEST REPORT
10. DATA PRESENTATION
11. INTERPRETATION OF RESULTS
12. NOTES
APPENDIX A (INFORMATIVE) - FLOW CHART OF AN EXAMPLE COUNTER TEST CODE
APPENDIX B (INFORMATIVE) - WORST CASE SOFTWARE DESCRIPTION
APPENDIX C (INFORMATIVE) - EXAMPLE CALIBRATION AND SET UP
VERIFICATION SHEET
Gives supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
DocumentType |
Standard
|
Pages |
17
|
PublisherName |
SAE International
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
SAE J 2578 : 2014 | RECOMMENDED PRACTICE FOR GENERAL FUEL CELL VEHICLE SAFETY |
SAE J1752/2_201609 | MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - SURFACE SCAN METHOD (LOOP PROBE METHOD) 10 MHZ TO 3 GHZ |
SAE J1752/3_201709 | MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - TEM/WIDEBAND TEM (GTEM) CELL METHOD; TEM CELL (150 KHZ TO 1 GHZ), WIDEBAND TEM CELL (150 KHZ TO 8 GHZ) |
SAE J1752/2_201609 | MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - SURFACE SCAN METHOD (LOOP PROBE METHOD) 10 MHZ TO 3 GHZ |
SAE J1752/3_201106 | MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - TEM/WIDEBAND TEM (GTEM) CELL METHOD; TEM CELL (150 KHZ TO 1 GHZ), WIDEBAND TEM CELL (150 KHZ TO 8 GHZ) |
SAE J1113/1_201310 | ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES AND LIMITS FOR COMPONENTS OF VEHICLES, BOATS (UP TO 15 M), AND MACHINES (EXCEPT AIRCRAFT) (16.6 HZ TO 18 GHZ) |
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