SAE J1752/2_199503
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS DIAGNOSTIC PROCEDURE 1 MHZ TO 1000 MHZ, MAGNETIC FIELD—LOOP PROBE
Hardcopy , PDF
21-01-2003
English
01-03-1995
Important note : Users cannot be edited or removed once added to your Multi user PDF.| DocumentType |
Standard
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| Pages |
24
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| PublisherName |
SAE International
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| Status |
Superseded
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| SupersededBy |
This SAE Recommended Practice defines a method for evaluating the near field magnetic component of the electromagnetic radiation from an integrated circuit. The method uses a shielded, single turn loop as a probe to measure magnetic emissions from 1 to 1000 MHz at a controlled distance and orientation from an integrated circuit. The method primarily measures the magnetic field generated by IC current loops perpendicular to the IC surface in the lead frame. This document is applicable to measurements from an individual IC mounted on a standardized test board or in-situ on a circuit board. Comparisons using the IC emissions reference levels require using identical circuit boards or the standardized IC test board.
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