SAE J1752/2_201609
Current
The latest, up-to-date edition.
MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - SURFACE SCAN METHOD (LOOP PROBE METHOD) 10 MHZ TO 3 GHZ
Hardcopy , PDF
English
16-09-2016
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1. SCOPE
2. REFERENCES
3. DEFINITIONS
4. TEST CONDITIONS
5. TEST EQUIPMENT
6. TEST SET-UP
7. TEST PROCEDURE
8. DATA PRESENTATION
9. NOTES
APPENDIX A - ANALYZING THE DATA FROM NEAR FIELD
SURFACE SCANNING
Describes a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC).
| DocumentType |
Standard
|
| Pages |
10
|
| ProductNote |
THIS VERSION IS NOW STABILIZED
|
| PublisherName |
SAE International
|
| Status |
Current
|
| Supersedes |
| SAE J 2578 : 2014 | RECOMMENDED PRACTICE FOR GENERAL FUEL CELL VEHICLE SAFETY |
| SAE J1752/1_201605 | ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS - INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES - GENERAL AND DEFINITIONS |
| SAE J1752/1_201605 | ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS - INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES - GENERAL AND DEFINITIONS |
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