SAE J1752/3_201709
Current
The latest, up-to-date edition.
MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - TEM/WIDEBAND TEM (GTEM) CELL METHOD; TEM CELL (150 KHZ TO 1 GHZ), WIDEBAND TEM CELL (150 KHZ TO 8 GHZ)
Hardcopy , PDF
English
22-09-2017
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1 Scope
2 References
3 Definitions
4 Test Conditions
5 Test equipment
6 Test set-up
7 Test procedure
8 Data presentation
9 IC Emissions reference levels
10 Notes
Appendix A - Example calibration and set up verification sheet
Appendix B - 1 GHz tem cell and wideband tem cell
Appendix C - Calculation of dipole moment from measured data
Appendix D - Specification of emission levels
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC).
| Committee |
EMCS
|
| DocumentType |
Standard
|
| Pages |
16
|
| ProductNote |
This standard is now stabilized
|
| PublisherName |
SAE International
|
| Status |
Current
|
| Supersedes |
| SAE J1752/1_201605 | ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS - INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES - GENERAL AND DEFINITIONS |
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