SAE J1879_201402
Current
The latest, up-to-date edition.
HANDBOOK FOR ROBUSTNESS VALIDATION OF SEMICONDUCTOR DEVICES IN AUTOMOTIVE APPLICATIONS
Hardcopy , PDF
English
21-02-2014
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1. INTRODUCTION
2. SCOPE
3. TERMS, DEFINITIONS AND ABBREVIATIONS
4. ROBUSTNESS VALIDATION BASICS
5. MISSION PROFILE/VEHICLE REQUIREMENTS
6. TECHNOLOGY DEVELOPMENT
7. PRODUCT DEVELOPMENT
8. POTENTIAL RISKS AND FAILURE MECHANISMS
9. CREATION OF THE QUALIFICATION PLAN
10. STRESS AND CHARACTERIZATION
11. ROBUSTNESS ASSESSMENT
12. IMPROVEMENT
13. MONITORING
14. REPORTING AND KNOWLEDGE EXCHANGE
15. EXAMPLES
16. ANNEX KNOWLEDGE MATRIX
17. ANNEX REPORTING TEMPLATE
18. REFERENCES AND ADDITIONAL READING
19. NOTES
Specifies intrinsic reliability of electronic components for use in automotive electronics.
| DocumentType |
Revision
|
| Pages |
57
|
| PublisherName |
SAE International
|
| Status |
Current
|
| Supersedes |
| SAE J1850_201510 | CLASS B DATA COMMUNICATIONS NETWORK INTERFACE |
| SAE J1211_201211 | HANDBOOK FOR ROBUSTNESS VALIDATION OF AUTOMOTIVE ELECTRICAL/ELECTRONIC MODULES |
| IEC TS 62686-1:2015 | Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors |
| PD ISO/PAS 19451-2:2016 | Application of ISO 26262:2011-2012 to semiconductors Application of hardware qualification |
| SAE J1938_201507 | PRODUCT DEVELOPMENT PROCESS AND CHECKLIST FOR VEHICLE ELECTRONIC SYSTEMS |
| ISO/PAS 19451-2:2016 | Application of ISO 26262:2011-2012 to semiconductors Part 2: Application of hardware qualification |
| PD IEC/TS 62686-1:2015 | Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications General requirements for high reliability integrated circuits and discrete semiconductors |
| ASTM F 617 : 2000 | Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006) |
| SAE J1211_201211 | HANDBOOK FOR ROBUSTNESS VALIDATION OF AUTOMOTIVE ELECTRICAL/ELECTRONIC MODULES |
| ISO 9001:2015 | Quality management systems — Requirements |
| ASTM F 1096 : 1987 | Method for Measuring Mosfet Saturated Threshold Voltage (Withdrawn 1992) |
| ASTM F 1260M : 1996 | Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric] |
| EIA 557 : 2006 | STATISTICAL PROCESS CONTROL SYSTEMS |
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