SEMI 3D14:2023
Current
Current
The latest, up-to-date edition.
Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products
Available format(s)
Hardcopy
Language(s)
English
Published date
01-05-2023
Important note : Users cannot be edited or removed once added to your Multi user PDF.To ensure consistent yield control of 3DS-IC products, common criteria for incoming quality control (IQC) and outgoing quality control (OQC) of outsourced subassembly and test (OSAT) are needed.
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Semiconductor Equipment & Materials Institute
|
| Status |
Current
|
| Supersedes |
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