SEMI C34 : 2013(R 2019)
Current
Current
The latest, up-to-date edition.
SPECIFICATION AND GUIDELINE FOR MIXED ACID ETCHANTS
Available format(s)
Hardcopy
Language(s)
English
Published date
12-01-2013
Specifies requirements for mixed acid etchants used in the semiconductor industry and testing procedures to support those standards.
DevelopmentNote |
Not available for sale from ILI, customer to contact SEMI. (05/2001) Supersedes SEMI C2-1 & SEMI C7.19. (03/2005)
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DocumentType |
Revision
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Pages |
0
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PublisherName |
Semiconductor Equipment & Materials Institute
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Status |
Current
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Supersedes |
ASTM F 1708 : 2002 | Standard Practice for Evaluation of Granular Polysilicon by Meter-Zoner Spectroscopies (Withdrawn 2003) |
SEMI MF391 : 2010E | TEST METHODS FOR MINORITY CARRIER DIFFUSION LENGTH IN EXTRINSIC SEMICONDUCTORS BY MEASUREMENT OF STEADY-STATE SURFACE PHOTOVOLTAGE |
SEMI MF1708 : 2004 | PRACTICE FOR EVALUATION OF GRANULAR POLYSILICON BY MELTER-ZONER SPECTROSCOPIES |
SEMI C2 : 1995 | SPECIFICATIONS FOR ETCHANTS |
SEMI C1 : 2010 | GUIDE FOR THE ANALYSIS OF LIQUID CHEMICALS |
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