SEMI D7 : 1994(R2003)
Current
Current
The latest, up-to-date edition.
FPD GLASS SUBSTRATE SURFACE ROUGHNESS MEASUREMENT METHOD
Published date
12-01-2013
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Specifies the method of FPD glass substrate surface roughness measurement by stylus method surface roughness measurement instrument. For use by vendors and/or buyers of glass substrates for flat panel display and is effective for all glass substrates used.
| DevelopmentNote |
Not available for sale from ILI, customer to contact SEMI. (05/2001)
|
| DocumentType |
Standard
|
| PublisherName |
Semiconductor Equipment & Materials Institute
|
| Status |
Current
|
| SEMI D9 : 2003(R2015) | TERMINOLOGY FOR FPD SUBSTRATES |
| SEMI D24 : 2000(R2006) | SPECIFICATION FOR GLASS SUBSTRATES USED TO MANUFACTURE FLAT PANEL DISPLAYS |
| BS IEC 62899-301-1:2017 | Printed electronics Equipment. Contact printing. Rigid master. Measurement method of plate master external dimension |
| 14/30317961 DC : 0 | BS EN 62903-1 ED.1 - PRINTED ELECTRONICS - EQUIPMENT - CONTACT PRINTING - RIGID MASTER - MEASUREMENT METHOD OF PLATE MASTER EXTERNAL DIMENSION |
| IEC 62899-301-1:2017 | Printed electronics - Part 301-1: Equipment - Contact printing - Rigid master - Measurement method of plate master external dimension |
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