SEMI E114 : 2002E(R2016)
Current
Current
The latest, up-to-date edition.
TEST METHOD FOR RF CABLE ASSEMBLIES USED IN SEMICONDUCTOR PROCESSING EQUIPMENT RF POWER DELIVERY SYSTEMS
Published date
12-01-2013
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Specifies a test method used to determine the electrical length, power losses, and characteristic impedance variation of RF cable assemblies used in RF power delivery systems for semiconductor processing equipment.
DevelopmentNote |
Not available for sale from ILI, customer to contact SEMI. (12/2002) E = Editorially modified to correct an error. (02/2009)
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DocumentType |
Standard
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PublisherName |
Semiconductor Equipment & Materials Institute
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Status |
Current
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SEMI E143 : 2006(R2018) | TEST METHOD FOR MEASURING POWER AND VARIATION INTO A 50-OHM LOAD AND POWER VARIATION AND SPECTRUM INTO A LOAD WITH A VSWR OF 2.0 AT ANY PHASE ANGLE |
SEMI E136 : 2004(R2018) | TEST METHOD FOR DETERMINING THE OUTPUT POWER OF RF GENERATORS USED IN SEMICONDUCTOR PROCESSING EQUIPMENT RF POWER DELIVERY SYSTEMS |
SEMI E113 : 2006(R2018) | SPECIFICATION FOR SEMICONDUCTOR PROCESSING EQUIPMENT RF POWER DELIVERY SYSTEMS |
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