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SEMI E135:2018(R2024)

Current

Current

The latest, up-to-date edition.

Test Method for RF Generators to Determine Transient Response for RF Power Delivery Systems Used in Semiconductor Processing Equipment

Available format(s)

Hardcopy

Language(s)

English

Published date

01-03-2024

This Standard defines a test method used to determine the transient response for a radio frequency (RF) generator used in RF power delivery systems for semiconductor processing equipment to support SEMI E113.

DocumentType
Test Method
Pages
0
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current
Supersedes

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€167.95
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