• Shopping Cart
    There are no items in your cart

SEMI G30 : 1988(R2011)

Current

Current

The latest, up-to-date edition.

TEST METHOD FOR JUNCTION-TO-CASE THERMAL RESISTANCE MEASUREMENTS OF CERAMIC PACKAGES

Published date

12-01-2013

Sorry this product is not available in your region.

Determines the thermal resistance of ceramic packages using thermal test chips. Deals only with junction-to-case or mounting surface measurements of thermal resistance and limits itself to heat sink and fluid bath testing environments. Following the outlined guidelines, junction-to-case thermal resistance measurements of ceramic packages using the heat sink and fluid bath methods should give the same results only under certain limited conditions, i.e., under conditions that approximate unidirectional heat flow through the chip and substrate to the preferred heat removal surface. If discrepancies occur, the heat sink mounting technique shall be considered as the referee test method.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (05/2001)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current

SEMI G68 : 1996(R2018) TEST METHOD FOR JUNCTION-TO-CASE THERMAL RESISTANCE MEASUREMENTS IN AIR ENVIRONMENT FOR SEMICONDUCTOR PACKAGES
SEMI G61 : 1994 SPECIFICATION FOR COFIRED CERAMIC PACKAGES
SEMI G1 : 1996 SPECIFICATION FOR CERDIP PACKAGE CONSTRUCTIONS

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.