SEMI G30 : 1988(R2011)
Current
The latest, up-to-date edition.
TEST METHOD FOR JUNCTION-TO-CASE THERMAL RESISTANCE MEASUREMENTS OF CERAMIC PACKAGES
12-01-2013
Determines the thermal resistance of ceramic packages using thermal test chips. Deals only with junction-to-case or mounting surface measurements of thermal resistance and limits itself to heat sink and fluid bath testing environments. Following the outlined guidelines, junction-to-case thermal resistance measurements of ceramic packages using the heat sink and fluid bath methods should give the same results only under certain limited conditions, i.e., under conditions that approximate unidirectional heat flow through the chip and substrate to the preferred heat removal surface. If discrepancies occur, the heat sink mounting technique shall be considered as the referee test method.
DevelopmentNote |
Not available for sale from ILI, customer to contact SEMI. (05/2001)
|
DocumentType |
Standard
|
PublisherName |
Semiconductor Equipment & Materials Institute
|
Status |
Current
|
SEMI G68 : 1996(R2018) | TEST METHOD FOR JUNCTION-TO-CASE THERMAL RESISTANCE MEASUREMENTS IN AIR ENVIRONMENT FOR SEMICONDUCTOR PACKAGES |
SEMI G61 : 1994 | SPECIFICATION FOR COFIRED CERAMIC PACKAGES |
SEMI G1 : 1996 | SPECIFICATION FOR CERDIP PACKAGE CONSTRUCTIONS |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.