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SEMI G52 : 2015

SEMI G52 : 2015

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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TEST METHOD FOR MEASUREMENT OF IONIC CONTAMINATION ON SEMICONDUCTOR LEADFRAMES

Superseded date

08-02-2021

Published date

12-01-2013

Publisher

Semiconductor Equipment & Materials Institute

Specifies the procedure to determine ionic contamination on leadframes using a water extraction method.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (05/2001)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Superseded
SupersededBy

SEMI G59 : 1994(R2018) TEST METHOD FOR MEASUREMENT OF IONIC CONTAMINATION ON LEADFRAME INTERLEAFING AND THE CONTAMINATION TRANSFERRED FROM THE INTERLEAFING TO THE LEADFRAMES
SEMI G64 : 1996(R2011) SPECIFICATION FOR FULL-PLATED INTEGRATED CIRCUIT LEADFRAMES (AU, AG, CU, NI, PD/NI, PD)

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