SEMI G52 : 2015
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
TEST METHOD FOR MEASUREMENT OF IONIC CONTAMINATION ON SEMICONDUCTOR LEADFRAMES
Superseded date
08-02-2021
Superseded by
Published date
12-01-2013
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Specifies the procedure to determine ionic contamination on leadframes using a water extraction method.
| DevelopmentNote |
Not available for sale from ILI, customer to contact SEMI. (05/2001)
|
| DocumentType |
Standard
|
| PublisherName |
Semiconductor Equipment & Materials Institute
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| Status |
Superseded
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| SupersededBy |
| SEMI G59 : 1994(R2018) | TEST METHOD FOR MEASUREMENT OF IONIC CONTAMINATION ON LEADFRAME INTERLEAFING AND THE CONTAMINATION TRANSFERRED FROM THE INTERLEAFING TO THE LEADFRAMES |
| SEMI G64 : 1996(R2011) | SPECIFICATION FOR FULL-PLATED INTEGRATED CIRCUIT LEADFRAMES (AU, AG, CU, NI, PD/NI, PD) |
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