SEMI G52:2020
Current
Current
The latest, up-to-date edition.
Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes
Available format(s)
Hardcopy
Language(s)
English
Published date
01-11-2020
Contamination on leadframes can contribute to semiconductor device reliability problems.
DocumentType |
Test Method
|
Pages |
0
|
PublisherName |
Semiconductor Equipment & Materials Institute
|
Status |
Current
|
Supersedes |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.