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SEMI G55 : 1993(R2011)

SEMI G55 : 1993(R2011)

Current

Current

The latest, up-to-date edition.

TEST METHOD FOR MEASUREMENT OF SILVER PLATING BRIGHTNESS

Published date

12-01-2013

Publisher

Semiconductor Equipment & Materials Institute

Describes standard method for measuring the brightness of silver plating on semiconductor leadframes. NOTE: Method determines quantitative measures which are not related directly to the traditional "Dull," "Semi-Bright," and "Bright" descriptors for silver plating. Test may be used for process control and outgoing inspection at the supplier or by the customer for incoming inspection.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (05/2001)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current

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