SEMI G55 : 1993(R2011)
Current
The latest, up-to-date edition.
TEST METHOD FOR MEASUREMENT OF SILVER PLATING BRIGHTNESS
12-01-2013
Describes standard method for measuring the brightness of silver plating on semiconductor leadframes. NOTE: Method determines quantitative measures which are not related directly to the traditional "Dull," "Semi-Bright," and "Bright" descriptors for silver plating. Test may be used for process control and outgoing inspection at the supplier or by the customer for incoming inspection.
| DevelopmentNote |
Not available for sale from ILI, customer to contact SEMI. (05/2001)
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| DocumentType |
Standard
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| PublisherName |
Semiconductor Equipment & Materials Institute
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| Status |
Current
|
| SEMI G20 : 1996 | SPECIFICATION FOR LEAD FINISHES FOR PLASTIC PACKAGES (ACTIVE DEVICES ONLY) |
| SEMI G64 : 1996(R2011) | SPECIFICATION FOR FULL-PLATED INTEGRATED CIRCUIT LEADFRAMES (AU, AG, CU, NI, PD/NI, PD) |
| SEMI G62 : 2018 | TEST METHOD FOR SILVER PLATING QUALITY |
| SEMI G21 : 2017 | SPECIFICATION FOR PLATING INTEGRATED CIRCUIT LEADFRAMES |
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